Gas detecting method and its detector

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United States of America Patent

PATENT NO 6128945
SERIAL NO

09145130

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Abstract

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A metal oxide semiconductor is subjected to a temperature change, and signals measured at two timings in the course of the temperature change are used to define a two-dimensional topological space. In the topological space, two axis, an axis indicating the concentration of the gas to be detected and an axis corresponding to drift are defined, and the topological space is represented by an oblique coordinate system. The gas concentration is determined from projection of measured data onto the gas concentration axis.

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Patent Owner(s)

Patent OwnerAddress
FIGARO ENGINEERING INCOSAKA JAPAN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Shinnishi, Kazuya Hyogo, JP 1 11
Shioiri, Akira Hyogo, JP 3 29
Takamatsu, Kazuko Osaka, JP 1 11
Udaka, Toshihiro Kobe, JP 2 16

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