Process for monitoring and control of the operation of an analyzer and of a manufacturing unit to which it is linked
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United States of America Patent
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Oct 3, 2000
Grant Date -
N/A
app pub date -
Oct 15, 1996
filing date -
Oct 16, 1995
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A process for monitoring and controlling a slave analyzer and a manufacturing unit linked to the slave analyzer, including the steps of a) feeding standard samples having a known characteristic to a master analyzer; b) generating master signals from the master analyzer based on the known characteristic of the standard samples; c) feeding the standard samples to the slave analyzer; d) generating slave signals from the slave analyzer based on the known characteristic of said standard samples; e) generating a transfer algorithm relating the slave signals to the master signals, the transfer algorithm being defined by parameters; f) periodically repeating steps c) through e); g) monitoring over time an indicator selected from the group consisting of one of the parameters and a function of at least two of the parameters; h) identifying a cause of alteration of the indicator based on a cause/effect diagram; and i) checking the slave analyzer and the manufacturing unit based on the cause of alteration of the indicator.
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