Delay line for an ultrasonic probe and method of using same
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United States of America Patent
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Sep 26, 2000
Issued Date -
N/A
app pub date -
Aug 12, 1999
filing date -
Feb 23, 1995
priority date (Note) -
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Abstract
An ultrasonic probe includes an ultrasonic transducer; a delay line acoustically coupled to said transducer so that ultrasonic vibrations may be transmitted into said delay line from said ultrasonic transducer in a first direction, said delay line includes a first section and a second section; the first and second sections forming an interface that is substantially perpendicular to said first direction; and the second section including a surface for coupling with a material to be investigated. The probe can be used to measure a thickness of a coating on a substrate by transmitting a signal in a first direction from the transducer into the delay line; measuring a time t.sub.1 for a first portion of the signal to travel round trip from the transducer and the interface; using the measured time t.sub.1 to calculate an expected time t.sub.2 for a second portion of the signal to travel round trip from the transducer to an opposite face of the delay line; measuring a time t.sub.3 that it takes for a third portion of the signal to travel round trip from the transducer and an interface between the coating and the substrate; and calculating a thickness of the coating based on a difference between the time t.sub.2 and the time t.sub.3.
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