Non-contact plasma probe for testing electrical continuity of printed wire boards
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United States of America Patent
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-
Sep 12, 2000
Grant Date -
N/A
app pub date -
Mar 6, 1998
filing date -
Jan 28, 1998
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A system for testing the electrical conductivity of printed traces, on multiple surfaces, of a printed wiring board using non-contacting probes. The non-contact probes generate a plasma in a plasma generating chamber that is used to apply a voltage to the printed wiring board. A measurement circuit determines the magnitude of the voltage on the printed wiring board.
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