Apparatus and method for calibrating a probe assembly of a measuring machine
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United States of America Patent
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Sep 5, 2000
Grant Date -
N/A
app pub date -
Jan 15, 1999
filing date -
Jan 15, 1999
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A precision measuring machine, such as a coordinate measuring machine, includes a probe assembly fixed to a movable member of the machine. The probe assembly includes a probe tip. A calibration object is detachably secured to the movable member in fixed relation to the probe assembly. The probe assembly articulates into a position such that the calibration object may be probed by the probe tip to recalibrate the probe assembly.
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