Transverse scanning densitometer

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United States of America Patent

PATENT NO 6081582
SERIAL NO

09187535

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A scanning densitometer provides transverse scanning of the patient with a small angle fan beam to significantly reduce parallax and image overlap blurring. Additional reduction of artifacts in the region of combined scans is obtained by a varying overlap of the scans when they are merged determined by a best matching of an identified structure within the scan. The matching process which reveals an ideal overlap provides height data of the structure allowing correction of magnification for structures which change in height within the patient over the scan.

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Patent Owner(s)

Patent OwnerAddress
LUNAR CORPORATION313 W BELTLINE HIGHWAY MADISON WI 53713

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bisek, Joseph P Madison, WI 9 460
Ergun, David L Verona, WI 14 453
Mazess, Richard B Madison, WI 67 2065
Washenko, Robert A Madison, WI 4 100

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