Non-contact method and apparatus to obtain a timing signal from internal integrated circuit nodes
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United States of America Patent
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Jun 13, 2000
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app pub date -
Dec 22, 1997
filing date -
Dec 22, 1997
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Abstract
A method and apparatus for triggering integrated circuit test equipment. More particularly, a method and apparatus for triggering integrated circuit test equipment by detecting photon energy emitted from a switching transistor on the integrated circuit. At the approximate moment in time when the switching transistor operates, photon energy is emitted. The photon energy typically in the form of light, is magnified and converted into an electrical signal. The electrical signal acts as a trigger to initiate the test equipment, such as data recording in the test equipment, at some predetermined time after emission of the photon energy. The recorded data can then be used to test and troubleshoot the integrated circuit.
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