X-ray diffractometer with adjustable image distance
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United States of America Patent
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May 30, 2000
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app pub date -
Apr 7, 1998
filing date -
Apr 7, 1998
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Abstract
An x-ray diffractometer system comprising an x-ray optic which directs x-rays, a sample placed into said directed x-rays, wherein said sample diffracts said directed x-rays, creating a diffraction pattern, a translation stage coupled to said sample for moving said sample within said directed x-rays, whereby the resolution, angular range, and intensity of said diffraction pattern may be adjusted, and an x-ray detector for registering said diffraction pattern.
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