Process for measuring the roughness of a material surface
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United States of America Patent
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May 23, 2000
Grant Date -
N/A
app pub date -
Nov 27, 1996
filing date -
Jan 7, 1994
priority date (Note) -
Expired
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Abstract
In order to measure the roughness of the surface of a material, in particular of a paper web, the surface of the material is illuminated with a parallel bundle of light beams and the scattering ellipse of the reflected light is evaluated. According to the invention, on optically rough surfaces the evaluation with respect to the scattering ellipse is done in a direction deviating from the major axis of the scattering ellipse.
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