Radiation induced single event latchup protection and recovery of integrated circuits
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United States of America Patent
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May 16, 2000
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N/A
app pub date -
Feb 25, 1997
filing date -
Feb 25, 1997
priority date (Note) -
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Abstract
An apparatus is disclosed for improving the Single Event Latchup (SEL) performance of an integrated circuit device (IC), or grouping of devices (as an example Multi-Chip Modules or MCMs), through the addition of active electronic circuitry integrated within the IC or MCM package. This circuitry and the protected device can be incorporated within the same physical dimensions and electrical configuration as the original integrated circuit device. The circuitry turns a destructive Latchup of a device into a recoverable event, allowing electronic devices that where unsuitable for the space environment due to SEL to be useable in the space environment.
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