High-mass detector with high mass-resolution for time-of-flight mass spectrometers
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United States of America Patent
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Apr 18, 2000
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Oct 14, 1997
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Oct 28, 1996
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Abstract
The invention relates to ion detectors for heavy ions with high mass resolution and high sensitivity usable in time-of-flight mass spectrometers. It relates to sensitive measuring methods for large masses in the range of about ten thousand to several hundred thousand atomic mass units. Specifically it relates to the conversion of large ions into smaller ions, which can then be detected with standard ion detectors for ions of smaller and average masses. The invention consists of a thin multichannel plate, such as is normally used for secondary-electron multiplication, used as a conversion device, in combination with a standard ion detector. However, in contrast to normal secondary-electron multiplier operation, it is operated at reversed polarity in order to produce large numbers of low-weight positive ions by a self-contained amplification process engaging secondary electrons accelerated in backward direction. This device and operating method leads to a reduction in signal width and offers high sensitivity for large ions.
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