Reliable wafer-scale integrated computing systems

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United States of America Patent

PATENT NO 6018812
SERIAL NO

07600204

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Abstract

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Wafer scale integrated circuitry which uses a cluster of wafer components, each component having a plurality of processing elements and a network element connected thereto for controlling the transfer of information to and from the processing elements. The network element is connected to network elements of other wafer components of the cluster for controlling the transfer of information to and from such other network elements. One or more redundant groups of processing elements are formed on the wafer components of the cluster, each redundant group being configured so that the processing elements in the group reside on different ones of the wafer components.

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Patent Owner(s)

Patent OwnerAddress
CHARLES STARK DRAPER LABORATORY INC THE A CORP OF MASSACHUSETTS555 TECHNOLOGY SQUARE CAMBRIDGE MA 02139

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Deyst, Jr John J Arlington, MA 1 6
Harper, Richard E Needham, MA 43 979
Lala, Jaynarayan H Wellesley, MA 5 169

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