Three dimensional tactile seam tracing device
Number of patents in Portfolio can not be more than 2000
United States of America Patent
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-
Jan 11, 2000
Grant Date -
N/A
app pub date -
Aug 7, 1998
filing date -
Aug 7, 1998
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The three dimensional probe device of the present invention is mountable on a working end of a fully automated and articulated robotic arm movable through at least five degrees of axial freedom in a global dimensional reference. The three dimensional probe device comprises a base, a carriage, a probe, a Z axis measuring apparatus and a tilt measuring apparatus. The probe tip contacts the work piece surface to be traced with deflections in the workpiece seam or path resulting in movement of the carriage and probe. The probe includes a plate and a ball which is pivotable in a ball socket portion of the carriage. Movement of the carriage in relation to the base provides measurement data for rotational change in the direction of the workpiece path or seam. Tilting of the probe provides measurement data for translational change in the direction of the workpiece path or seam.
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