Method and equipment for automatically testing electronic components
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United States of America Patent
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Dec 21, 1999
Grant Date -
N/A
app pub date -
May 14, 1997
filing date -
Dec 23, 1994
priority date (Note) -
Expired
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Abstract
Method and apparatus of testing electronic components in parallel employs instructions which are contained in a memory. The instructions include information relating to test to be performed on a plurality of components to be tested in parallel after the components have been matched using a matching sequence. The method makes it possible to eliminate the matching sequence for matching a component after its matching sequence has not succeeded after a predetermined time period, while allowing the other components to be matched.
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