Frequency sorter, and frequency locker for monitoring frequency shift of radiation source
Number of patents in Portfolio can not be more than 2000
United States of America Patent
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Dec 21, 1999
Grant Date -
N/A
app pub date -
Aug 1, 1997
filing date -
Aug 1, 1997
priority date (Note) -
Expired
status (Latency Note)
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Abstract
In order to tune the frequencies of radiation sources, a frequency locker is provided having equally spaced periodic frequencies with a spectral range substantially equal to the frequency spacing of a plurality of radiation sources with equally spaced apart frequencies. The periodic frequencies of the locker are slightly offset from those of the radiation sources. Radiation from each of the sources is passed through the locker and the radiation passed by the locker is detected and used to adjust the frequencies of the sources in order to tune the sources. The frequency locker includes an etalon with dimensions accurate to 0.5 microns or better. The dimension of the etalon may be controlled by controlling the thickness of spacers for maintaining vacuum or air gaps where the dimensions may be altered by thin film deposition and etching techniques. The optical path length of the etalon may also be changed by altering the angle of incidence of an incoming beam with the reflective surfaces of the etalon.
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