Wafer having a laser mark on chamfered edge

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United States of America Patent

PATENT NO 6004405
SERIAL NO

09036875

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A wafer 1 has a chamfered edge 2 polished to specular glossiness, and a laser mark for indication of crystal orientation is put on the chamfered edge 2. Another laser mark 4 for indication of specification, production number, identification, etc. may be carved as a bar code on the chamfered edge 2. These marks 3, 4 are carved on the chamfered edge 2 by laser marking which does not put any harmful influences on the wafer 1.

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Patent Owner(s)

Patent OwnerAddress
SUPER SILICON CRYSTAL RESEARCH INSTITUTE CORPANNAKA-SHI GUNMA-KEN 379-0125

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Asakawa, Keiichiro Annaka, JP 11 103
Oishi, Hiroshi Annaka, JP 82 922

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