Partitioning and reordering methods for static test sequence compaction of sequential circuits
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United States of America Patent
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Nov 9, 1999
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app pub date -
Dec 31, 1997
filing date -
Dec 31, 1997
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Abstract
Methods of compacting sequential circuit test vector set by partitioning of faults into hard and easy faults, re-ordering vectors in a test set by moving sequences that detect hard faults to the beginning of the test set, and a combination of partitioning and re-ordering.
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