Method and apparatus measuring edges on a workpiece
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United States of America Patent
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Nov 9, 1999
Grant Date -
N/A
app pub date -
Oct 20, 1997
filing date -
Oct 21, 1996
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The invention is directed to a method and an apparatus for measuring the edges 13 of a workpiece 5 with an optical probe 4. The probe 4 measures the distance values (a) between the probe 4 and an adjustable scanning point 15. In the method, the scanning point 15 is moved along a loop path (36a, 36b, . . . , 36n) over the edge 13 of the workpiece 5 to be measured in order to obtain more exact values for measured points of the edge at a higher measuring speed. During the method, distance values (a) are measured by the probe 4 and a point P of the edge 13 is determined from the course of the measured values.
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