Measuring surface flatness using shadow moire technology and phase-stepping image processing

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 5969819
SERIAL NO

09090058

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

A two-dimensional array of phase values is calculated from digitized phase-shifted shadow moire fringe patterns that are indicative of the flatness of the surface of an object. The light intensity 'I.sub.1 ' of a pixel in a first of such shadow moire fringe patterns is approximated by I.sub.0 +Acos.o slashed., the light intensity 'I.sub.2 ' of the pixel in a second of such shadow moire fringe patterns is approximated by I.sub.0 +Acos[.o slashed.+(.pi./2)], the light intensity 'I.sub.3 ' of the pixel in a third of such shadow moire fringe patterns is approximated by I.sub.0 +Acos[.o slashed.+.pi.], and the light intensity 'I.sub.4 ' of the pixel in a fourth of such shadow moire fringe patterns is approximated by Acos[.o slashed.+(3.pi.)/2)]. The phase values '.o slashed.' are equal to arctan((I.sub.2 -I.sub.4)/(I.sub.1 -I.sub.3), and a first two-dimensional array of phase values are calculated. A plurality of two-dimensional arrays of image values are calculated from a first two-dimensional array of phase values, and the two-dimensional arrays of image values are filtered. A second two-dimensional array of phase values is calculated from the filtered two-dimensional arrays of image values. Discontinuities between adjacent phase values in the second two-dimensional array of phase values are identified by searching along a plurality of one-dimensional arrays of the two-dimensional array of phase values, and those discontinuities are adjusted. After the first row and, thereafter, the first column are searched, the other rows are sequentially searched, and thereafter the other columns may be sequentially searched.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
AKROMETRIX LLC2700 NE EXPRESSWAY BUILDING B SUITE 500 ATLANTA GA 30345

International Classification(s)

  • [Classification Symbol]
  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Wang, Yinyan Atlanta, GA 8 91

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation