Method for fabricating a single-crystal semiconductor

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United States of America Patent

PATENT NO 5968260
SERIAL NO

08829412

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Abstract

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A method for fabricating a single-crystal semiconductor by means of CZ method is disclosed. The method separates the single-crystal semiconductor from the melt by increasing the lift rate when the growth of a crystal body is finished. By controlling the lift rate, the single-crystal semiconductor is then gradually cooled within a range of an arbitrary crystal temperature, thereby forming a concave separated surface. The single-crystal semiconductor is cooled at a rate of lower than 35.degree. C./min when the temperature of the separated surface is within a range between the melting point and 1000.degree. C., or by keeping the temperature of the separated surface within a range between 1250.degree. C. and 1000.degree. C. for more than 30 minutes. Therefore, no dislocation is introduced in the crystal body, and productivity is improved.

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Patent Owner(s)

Patent OwnerAddress
KOMATSU ELECTRONIC METALS CO LTDKANAGAWA-KEN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Iida, Tetsuhiro Hiratsuka, JP 8 28
Kubota, Toshimichi Hiratsuka, JP 38 306
Nakamura, Kouzou Hiratsuka, JP 19 287
Saishouji, Toshiaki Hiratsuka, JP 3 45
Tomioka, Junsuke Hiratsuka, JP 23 177

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