Contact test method and system for memory testers
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United States of America Patent
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Sep 21, 1999
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N/A
app pub date -
Mar 2, 1998
filing date -
Mar 2, 1998
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Abstract
A method and system for memory testers which detects the absence of contact between memory tester pins and memory module pins, and which identifies memory module pins which are shorted to a power supply terminal or to ground, pins which are shorted to other pins, and pins which are open.
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