Optical inspection system
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United States of America Patent
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Sep 21, 1999
Grant Date -
N/A
app pub date -
Jun 20, 1997
filing date -
Jul 25, 1995
priority date (Note) -
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status (Latency Note)
Importance
Abstract
An optical inspection system inspect products passed through an inspection region. Light is directed onto the products form optical control units including light emitting diodes. Light emitted from the diodes is directed by cylindrical lenses onto the products at a specified target region, and a sensor detects light reflected from the products. Focussing is achieved by an outer row of the diodes being displaced outwardly relative to axes of respectively cylindrical lenses, so that light originating from the outer rows of diodes converges towards that passing along a central axis extending from a central row of the diodes through a central lens to the target region, light from all rows of the diodes being therefore focussed substantially at the target region.
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