Off-track tester for testing MR head and method of testing the same
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United States of America Patent
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Aug 10, 1999
Grant Date -
N/A
app pub date -
Jul 29, 1997
filing date -
Jul 30, 1996
priority date (Note) -
In Force
status (Latency Note)
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Abstract
An off-track characteristics tester for testing an off-track characteristics of an MR head, according to the present invention, comprises spiral scan type read-out unit for reading out a test data recorded on a track of a disk by spirally scanning the track by the MR head while shifting the MR head radially of the disk at such a shifting rate that the MR head traverses a maximum measuring pitch .DELTA.R necessary to obtain data of an off-track profile curve a plurality of times, average value calculation unit responsive to a read-out signal from the read-out unit to calculate an average value TAA of the test data from the read-out unit every revolution of the disk and a memory for storing the average value TAA for each revolution of the disk together with the radial positions of the MR head, wherein the data of the off-track profile curve is obtained from the average value TAA and the data of the radial positions stored in the memory in every revolution.

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- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
---|---|---|
HITACHI ELECTRONICS ENGINEERING CO LTD | SHIBUYA-KU TOKYO 150 |
International Classification(s)
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Mukohara, Noriaki | Hadano, JP | 1 | 9 |
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Maintenance Fees
Fee | Large entity fee | small entity fee | micro entity fee | due date |
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Fee | Large entity fee | small entity fee | micro entity fee |
---|---|---|---|
Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
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