Test method and apparatus utilizing reactive charging currents to determine whether a test sample is properly connected
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United States of America Patent
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Aug 10, 1999
Grant Date -
N/A
app pub date -
Jun 5, 1997
filing date -
Jun 5, 1997
priority date (Note) -
Expired
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Abstract
Prior to beginning a dielectric withstand (leakage current) or insulative impedance test, but after applying the high voltage that will be used in the test, the temporary charging currents resulting from application of the high voltage are measured and analyzed to determine if the test sample is properly connected to the test apparatus. If no charging currents are measured, or if the insulation resistance is too high, then it is determined that the test sample is not properly connected and the test is terminated.
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