Method and system for obtaining x-ray single photon spectroscopic data using room-temperature solid state detectors by measuring the induced electron current
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Aug 10, 1999
Grant Date -
N/A
app pub date -
Oct 16, 1997
filing date -
Oct 23, 1996
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A method and a system for obtaining spectroscopic data of a single photon of a given energy that undergoes an interaction, beginning at a given point in time, with a room-temperature solid state detector of a given thickness and fitted with two electrodes, which detection is held at a given bias by a voltage applied to the electrodes. In the course of the interaction, pairs of electrons and holes are created within the solid state detector which induce charge on the electrodes; the method and system enable for determination of a current induced by the electrons, being a measurable and quite accurate parameter for deducing spectroscopic data. The electron induced current is defined as the charge induced on the electrodes due to the electrons only, divided by the time it takes the electrons to induce this charge. The mentioned time is considered equal to that of a particular portion of a signal of the complete induced charge, and both the time and the charge are determined by the method and the system.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully