Method for space-charge control of daughter ions in ion traps

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United States of America Patent

PATENT NO 5936241
SERIAL NO

09032579

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Abstract

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The invention consists of deriving the control of the space charge in the ion trap for the initial daughter ion spectrum from the filling rates of previous normal spectra, from the abundance ratio of the parent ions to be isolated to the total ions in the spectrum, and from the at least roughly known isolation and fragmentation yields. For further daughter ion spectra, the resulting measured overall filling rate with daughter ions may be used. The same applies in an analogue way to spectra of isolated ions or of ions from MS.sup.n processes.

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Patent Owner(s)

Patent OwnerAddress
BRUKER-FRANZEN ANALYTIK GMBHKATTENTURMER HEERSTRASSE 122 D-2800 BREMEN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Franzen, Jochen Bremen, DE 156 4040
Schubert, Michael Bremen, DE 63 664

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