Linear time-of-flight mass spectrometer with high mass resolution
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United States of America Patent
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May 18, 1999
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N/A
app pub date -
Aug 28, 1997
filing date -
Sep 3, 1996
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Abstract
The invention relates to a linear time-of-flight mass spectrometer with ionization of analyte substances from surfaces and with improvement in mass resolution through delayed ion acceleration. It especially relates to the design of such a mass spectrometer and to a mass spectrometric measuring procedure for very high mass resolution in the spectrum. The invention focuses the flight time of the ions in second order by dynamic alteration of at least one of the accelerating voltages applied to the ion source after the start of the delayed acceleration of the ions. In a most simple method, an easily generated exponential decay of the accelerating field in front of the sample support can be used. In computer simulations, resolutions of much greater than one million have been obtained.
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