High resolution ion detection for linear time-of-flight mass spectrometers
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Apr 27, 1999
Grant Date -
N/A
app pub date -
Aug 29, 1997
filing date -
Sep 3, 1996
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A high resolution linear tine-of-flight mass spectrometer consists of clearing the analyte ions to be detected of neutral and charged fragments by applying of an electrical deflection perpendicular to the flight direction in conjunction with a direction-filtering diaphragm, in order to avoid smearing of the signal by their deviations in velocity. The mass spectrometer simultaneously allows the ions to be post-accelerated to very high energies before detection without a grid. In this way it is possible to reduce the acceleration energy of the ions before the flight path so that the high resolution is also measurable in practice due to increased flight times.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully