Infrared photodetector with doping superlattice structure

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United States of America Patent

PATENT NO 5895930
SERIAL NO

08891495

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Abstract

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This invention provides infrared sensing photodetector and a method therefor which provides a structure for effectively absorbing a light incident in a normal direction on a substrate, and a method compatible with existing processes for making integrated circuitry. An infrared sensing photodetector includes a compound semiconductor substrate of a first conductivity type, superlattice areas having implanted impurity ions of a second conductivity type opposite to the compound semiconductor substrate, each being spaced a predetermined distance each other in a selected region of the semiconductor substrate, a first collector area and a first emitter area which are formed in both end portions positioned perpendicular relative to the doped superlattice areas, a first collector electrode and a first emitter electrode formed on the first collector area and the first emitter area, respectively, a second collector area and a second emitter area which are spaced a predetermined distance in a horizontal direction on the doped superlattice area, and a second collector electrode and a second emitter electrode formed on the second collector area and the second emitter area, respectively.

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Patent Owner(s)

Patent OwnerAddress
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH161 KAJONG-DONG YUSONG-GU DAEJON-SHI

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Oh, Eung-Gie Daejeon, KR 3 20
Park, Chul-Soon Daejeon, KR 11 90
Pyun, Kwang-Eui Daejeon, KR 12 151
Yang, Jeon-Wook Daejeon, KR 3 21

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