Method of fabricating a compound semiconductor device

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United States of America Patent

PATENT NO 5885847
SERIAL NO

08835957

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Abstract

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The invention relates to a method of fabricating a compound semiconductor device by forming a first and a second compound semiconductor devices having a plurality of different epitaxial layers on a common semiconductor substrate. The method comprises the steps of sequentially forming a plurality of first epitaxial layers for manufacturing the first compound semiconductor device on the semiconductor substrate; forming a first insulating film pattern for defining an active region of the first compound semiconductor device; etching the plurality of first epitaxial layers using the first insulating film pattern as a mask; forming a second insulating film on the resultant structure; forming a sidewall insulating spacer on the sidewall of the active region of the first compound semiconductor device by dry etching the second insulating film; sequentially forming a plurality of second epitaxial layers for manufacturing the second compound semiconductor device on the portion from which the plurality of first epitaxial layers is etched back; forming each electrode of the first and second compound semiconductor devices; and forming an interconnection electrode interconnecting each electrode of the first and second compound semiconductor devices.

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Patent Owner(s)

Patent OwnerAddress
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTEDAEJEON

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Lee, Jin-Hee Daejeon, KR 35 324
Park, Byung-Sun Daejeon, KR 20 72
Park, Chul-Sun Daejeon, KR 4 36
Pyun, Kwang-Eui Daejeon, KR 12 151
Yoon, Hyung-Sup Daejeon, KR 4 31

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