Ion trap mass spectrometer with vacuum-external ion generation
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United States of America Patent
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Jan 12, 1999
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N/A
app pub date -
Jun 28, 1996
filing date -
Jun 30, 1995
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Expired
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Abstract
The invention relates to an RF quadrupole ion trap mass spectrometer with ionization of the substance molecules outside the vacuum system. The invention consists of using only a single high-vacuum pump for generating the vacuum without any differential pump stages and generating the necessary pressure stages for operating the mass spectrometer by means of a sequence of openings with adjusted conductances. The necessarily very small inlet opening to the vacuum system is only able to transport very small quantities of ions of the analyzed substances in the gas stream. However, these quantities are adequate for operating the mass spectrometer because the ion trap used as mass spectrometer is capable of collecting and storing ions over relatively long periods of time.
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