Coaxial double-headed spring contact probe assembly and coaxial surface contact for engagement therewith
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United States of America Patent
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Dec 15, 1998
Issued Date -
N/A
app pub date -
Jul 31, 1996
filing date -
Mar 10, 1992
priority date (Note) -
Expired
status (Latency Note)
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Abstract
An electrical test probe assembly for loaded board testing includes a housing having a hollow interior, and first and second opposite shields positioned and axially slidable in the housing and outwardly biased against each other. The first and second opposite shields form first and second shield cavities, respectively. In addition, the electrical test probe assembly includes first and second opposite insulators positioned and axially slidable in the first and second shield cavities, respectively. The first and second opposite insulators form an insulator cavity extending along the housing. Finally, the electrical test probe assembly includes first and second opposite plungers positioned and axially slidable in the insulator cavity of the first and second opposite insulators and outwardly biased against each other.
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