Dual-energy x-ray detector providing spatial and temporal interpolation

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United States of America Patent

PATENT NO 5841832
SERIAL NO

08938992

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Abstract

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A side-by-side x-ray detector provides dual energy measurements in a scanned configuration where high and low energy detector elements are interspersed. Alternating high and low energy detector elements in both row and column allows for interpolation and time and space providing virtual measurements at identical times and locations reducing image artifacts and errors caused by edges in the image. The resulting detector may be suitable for a variety of imaging applications including medical densitometry and baggage scanning.

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Patent Owner(s)

Patent OwnerAddress
LUNAR CORPORATION313 W BELTLINE HIGHWAY MADISON WI 53713

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Gauntt, David M Madison, WI 17 227
Mazess, Richard B Madison, WI 67 2065

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