Opto-electronic measuring apparatus for checking linear dimensions
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United States of America Patent
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Nov 24, 1998
Grant Date -
N/A
app pub date -
Oct 7, 1997
filing date -
Apr 13, 1995
priority date (Note) -
Expired
status (Latency Note)
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Abstract
An apparatus for checking linear dimensions of a workpiece (10) according to the shadow casting technique, including a bed (1), a first support structure (5, 6) sustained by the bed for supporting the workpiece, a second support structure (4), optical sources (22-25) coupled to the second support structure (4) for generating associated beams of light, a plurality of linear photosensitive devices (26-29) coupled to the second support structure (4) for receiving the beams of light after they have been intercepted by the workpiece, and detecting circuits (20, 21) connected to the photosensitive devices (26-29). The optical sources (22-25) are arranged in two units (22, 23; 24, 25) at opposite sides with respect to the workpiece, and the photosensitive devices (26-29) are also arranged in two units (26, 27; 28, 29) located at opposite sides with respect to the workpiece. Two optical beam splitters (30, 31) coupled to the second support structure (4) partially reflect the beams of light emitted by the optical sources and generate two sections of beams of light directed in opposite directions, that fall on the workpiece and reach the photosensitive devices (26-29). The photosensitive devices are substantially arranged in a same transversal plane.
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