Intracavity laser spectroscopy for high sensitivity detection of contaminants in gas
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United States of America Patent
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Nov 24, 1998
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app pub date -
Jun 13, 1997
filing date -
Sep 1, 1995
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Abstract
Contaminants are detected optically at concentrations below 1 part-per-million (ppm) and extending to a level approaching 1 part-per-trillion (ppt) by using intracavity laser spectroscopy (ILS) techniques. A solid-state laser with an ion-doped crystal medium contained in an optical resonator cavity (the ILS laser) is employed as a detector. A gas sample containing gaseous contaminant species is placed inside the optical resonator cavity and on one side of the ion-doped crystal. The output signal from the ILS laser is detected and analyzed to identify the gaseous species. The concentration of the gaseous species can be determined as well.
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