Method and apparatus for improved temperature control in rapid thermal processing (RTP) systems

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United States of America Patent

PATENT NO 5841110
SERIAL NO

08920614

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Abstract

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A method for Rapid Thermal Processing (RTP) is presented, wherein the broadband reflectivity of an object is measured, and the results of the measurement used by the RTP system to adjust the RTP system parameters used in processing the object.

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Patent Owner(s)

Patent OwnerAddress
AST ELEKTRONIK GMBHBENZSTR 1 85551 KIRCHHEIM

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Knarr, Thomas Langenau, DE 5 169
Maurer, Michael Ulm, DE 55 622
Nenyei, Zsolt Blaustein, DE 16 341
Walk, Heinrich Allmendingen, DE 11 266

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