Apparatus for measuring particle morphology and method thereof
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United States of America Patent
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Oct 20, 1998
Grant Date -
N/A
app pub date -
Dec 20, 1996
filing date -
Dec 22, 1995
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A particle measuring apparatus includes a resistance detecting section for converting a sample solution containing particles into sample flow to detect an electric resistance thereof, an image capturing section for converting the sample solution into a flat flow to capture an image of the flat flow on a wider side thereof to obtain a particle image, and an analyzing section for analyzing a particle on the basis of the detected electric resistance and the captured particle image, the analyzing section including a first detecting section for detecting information on a volume of each particle from the detected electric resistance, a second detecting section for detecting information on a projected area of each particle from the captured particle image, a depth calculating section for calculating information on a depth dimension of the particle by using a first particle size distribution calculated on the basis of the information on the volume and a second particle size distribution calculated on the basis of the information on the projected area, and an output control section for causing-an output section to output the information on the depth dimension and the captured particle image.
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