Method and apparatus for low signal to noise ratio instantaneous phase measurement
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United States of America Patent
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Sep 15, 1998
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N/A
app pub date -
May 31, 1996
filing date -
May 31, 1996
priority date (Note) -
Expired
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Abstract
The system and method of the present invention generates high resolution phase measurements without the high processing and memory overhead requirements found in prior art circuits and methods. Each signal sample (of N samples) is divided further into J segments each segment having K samples. The frequency is computed with respect to one J segment and is used in the phase measurement computations performed for the remaining segments. The phase measurements performed with respect to each J segment are then averaged to compute a high resolution phase measurement for the corresponding N segment.
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