Flaw detection apparatus employing tire probes having ultrasonic oscillators mounted therein
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United States of America Patent
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Jul 28, 1998
Issued Date -
N/A
app pub date -
Nov 15, 1996
filing date -
Nov 12, 1993
priority date (Note) -
Expired
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Abstract
An apparatus for detecting flaws using supersonic waves measures a thickness of a test object or a position of a cavity inside the test object by employing a pair of ultrasonic probes. By, changing a relative position of one ultrasonic probe to that of the other ultrasonic probe, a plurality of waveform data of ultrasonic reception signals is acquired. Each of the acquired waveform data is added together. Because a surface wave component of each waveform data has a shifted phase due to a difference in arrival times, a level of the surface wave component is offset and thus minimized through addition of the waveform data.
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