Waveform analyzer

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United States of America Patent

PATENT NO 5784285
SERIAL NO

08792732

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Abstract

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Disclosed is a waveform analyzer, which inputs measured data of an electronic device to be analyzed; generates an orthogonal analyzing wavelet; produces wavelet-analyzed components in which the measured data is wavelet-transformed into a plurality of wavelet spectra by using the orthogonal analyzing wavelet, thereafter the plurality of wavelet spectra are inverse-wavelet-transformed to produce the wavelet-analyzed components; and adds up a component with an order corresponding to a desired filter characteristic of the wavelet-analyzed components to get a filtered waveform.

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Patent Owner(s)

Patent OwnerAddress
NEC CORPORATION7-1 SHIBA 5-CHOME MINATO-KU TOKYO 108-8001

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Masuda, Norio Tokyo, JP 35 366
Tamaki, Naoya Tokyo, JP 15 160
Tohya, Hirokazu Tokyo, JP 29 696

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