Analytical system for trace element

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United States of America Patent

PATENT NO 5783740
SERIAL NO

08794699

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Abstract

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An analytical system for a trace element, which includes a pressure pump for continuously feeding a carrier solution, a first sample introduction unit for introducing a sample and a reagent using sample loops and switching valves, a first flow passage including a pre-treatment unit for pre-treating the sample by heating, and a second flow passage separated from in pressure from the first flow passage, wherein the sample pre-treated in the first flow passage is sampled into the second flow passage through a second sample introduction unit, and the sample thus sampled in the second flow passage is allowed to coloredly react with a coloring agent and measured in absorbance.

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Patent Owner(s)

Patent OwnerAddress
HITACHI LTD6-6 MARUNOUCHI 1-CHOME CHIYODA-KU TOKYO 1008280 ?1008280

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kuroishi, Tadafumi Naka-gun, JP 7 284
Tawarayama, Naomi Yokohama, JP 1 12

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