Burn-in activity monitor
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United States of America Patent
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Jun 23, 1998
Grant Date -
N/A
app pub date -
Oct 8, 1996
filing date -
Oct 8, 1996
priority date (Note) -
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Abstract
According to the present invention, the invention relates to a semiconductor device having an activity monitor circuit formed thereon for monitoring the switching activity of signals generated by other circuits on the device during burn-in testing. In one embodiment, the activity monitor circuit includes means for detecting a present state of a signal; means for comparing the present state with a previous state of the signal; means for determining whether the state of the signal has switched a requisite number of times in a predetermined time period; and means for displaying the results of the determination.
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