Sampling apparatus
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Jun 9, 1998
Grant Date -
N/A
app pub date -
Dec 19, 1996
filing date -
Dec 19, 1995
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A sample apparatus includes a sampling valve having a sample inlet through which a sample such as urine is introduced from the outside of the sampling valve to the inside thereof; a sample outlet through which the sample is sent from the inside of the sampling valve to the outside thereof; and a sampling passage for setting apart a predetermined amount of the sample between the sample inlet and sample outlet. It further includes a first electrode section located close to the sample inlet so that the sample can come into contact with the first electrode section, a second electrode section located close to the sample outlet so that the sample can come into contact with the second electrode section, and a sensor circuit for measuring the impedance between the first and second electrode sections and for using the measured impedance to determine whether or not the sampling passage contains a predetermined amount of the sample. Preferably, the first and second electrode sections each include a pair of electrodes separated from each other, wherein one of each of the electrodes of the electrode sections is connected to the sensor circuit while the other electrodes are short-circuited to each other.
First Claim
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Family

- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
---|---|---|
TOA MEDICAL ELECTRONICS CO LTD | KOBE-SHI HYOGO-KEN |
International Classification(s)
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Nishimoto, Hidetoshi | Kakogawa, JP | 8 | 58 |
# of filed Patents : 8 Total Citations : 58 | |||
Ooyama, Yasuhiro | Kobe, JP | 1 | 4 |
# of filed Patents : 1 Total Citations : 4 | |||
Seshimo, Hiroyuki | Kobe, JP | 5 | 200 |
# of filed Patents : 5 Total Citations : 200 | |||
Tanaka, Yosuke | Kobe, JP | 64 | 565 |
# of filed Patents : 64 Total Citations : 565 |
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Patent Citation Ranking
- 4 Citation Count
- G01N Class
- 2.26 % this patent is cited more than
- 27 Age
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Maintenance Fees
Fee | Large entity fee | small entity fee | micro entity fee | due date |
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Fee | Large entity fee | small entity fee | micro entity fee |
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Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
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