Apparatus and method for analyzing particles including shifting a judgement region

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United States of America Patent

PATENT NO 5735274
SERIAL NO

08675260

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An apparatus and method for analyzing particles includes a distribution data preparation device for measuring parameters that characterize particles contained in a specimen and for preparing a distribution data of the particles in a coordinate space based on the parameters, a judgement region storage device for storing in advance a predetermined judgement region in the coordinate space, a base point extraction device for extracting, when the distribution data forms at least one group, a group base point that shows a position of the group, a judgement region correction device for correcting a position of the judgement region in the coordinate space by referring to each group base point extracted every time a distribution data is prepared by the distribution data preparation device, and a judgement device for judging the specimen based on the particles present within the corrected judgement region.

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Patent Owner(s)

Patent OwnerAddress
TOA MEDICAL ELECTRONICS CO LTDKOBE-SHI HYOGO-KEN

International Classification(s)

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  • 1996 Application Filing Year
  • A61B Class
  • 2987 Applications Filed
  • 1707 Patents Issued To-Date
  • 57.15 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances1996199719981999200020012002200320042005200620070255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Mishima, Yoshihiro Kobe, JP 19 113
Shibata, Kimiyo Kakogawa, JP 2 8

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Patent Citation Ranking

  • 3 Citation Count
  • A61B Class
  • 0.43 % this patent is cited more than
  • 27 Age
Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges31691559770403119201897401 - 1011 - 2021 - 3031 - 4041 - 5051 - 6061 - 7071 - 8081 - 9091 - 100100 +0102030405060708090100110120130140150160170180

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