Device and method for testing an optical element subjected to radiation
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United States of America Patent
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Mar 31, 1998
Grant Date -
N/A
app pub date -
Dec 22, 1995
filing date -
Dec 26, 1994
priority date (Note) -
Expired
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Abstract
Device and method for testing an optical element (E) to determine ability to withstand heating by a high-energy luminous beam. The contact of a point (11) is applied to the optical element and is heated to a specific temperature to simulate radiation. The contact point includes a dog point having a sectional configuration similar to a track of a simulated radiation beam. The heat can be adjusted and the temperature sensed.
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