Memory test system
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United States of America Patent
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Feb 24, 1998
Grant Date -
N/A
app pub date -
Dec 16, 1996
filing date -
Jun 15, 1994
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A process for reducing the test requirements of memory devices once they are packaged into modules by using a unique identification of a memory device based on the locations or types and locations of some of the defects in that memory device. The unique identification is used as an index to access a database containing more information on the types and locations of defects within that memory device. The information is then stored in a non-volatile memory on the module containing that memory device.
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