Light measuring apparatus for quantizing photon
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United States of America Patent
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Dec 2, 1997
Grant Date -
N/A
app pub date -
Dec 17, 1996
filing date -
Dec 19, 1995
priority date (Note) -
Expired
status (Latency Note)
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Abstract
When incident light is incident to a photodetector, photoelectrons are emitted and multiplied in each of incident zones whereby a plurality of current signals are output. These current signals each are processed to estimate a distribution or a mean value of numbers of photoelectrons generated in each incident zone. Then estimated based on the estimate values of respective incident zones is the number of photoelectrons emitted from the entire photoelectric conversion surface. In this way the intensity of incident light is measured with accuracy.
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