Pattern forming material including photoacid and photobase generators for large exposure latitude

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United States of America Patent

PATENT NO 5691100
SERIAL NO

08623735

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Abstract

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A material for the formation of a pattern is provided which has a wide exposure latitude and is less liable to cause a dimensional change of a pattern with a change in exposure. The material comprises (A) a compound having a capability of producing an acid upon irradiation with an active beam, (B) a compound capable of producing a base or increasing its basicity, (C) a compound having at least one bond clearable with an acid and/or (D) a compound insoluble in water but soluble in an aqueous alkaline solution.

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Patent Owner(s)

Patent OwnerAddress
AZ ELECTRONIC MATERIALS USA CORP70 MEISTER AVENUE SOMERVILLE NJ 08876

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Endo, Natsumi Kawagoe, JP 7 87
Kinoshita, Yoshiaki Tokyo, JP 58 722
Kudo, Takanori Sayama, JP 41 577
Masuda, Seiya Tokorozawa, JP 13 184
Okazaki, Hiroshi Kawagoe, JP 157 2266
Przybilla, Klaus Frankfurt, DE 1 39
Suehiro, Natsumi Kawagoe, JP 6 121

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