Method and apparatus for determining a particle criterion and particle analyzer using the criterion
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United States of America Patent
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Nov 25, 1997
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N/A
app pub date -
Jul 3, 1996
filing date -
Jul 4, 1995
priority date (Note) -
Expired
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Abstract
A method and apparatus for determining a particle criterion to set a predetermined region as the particle criterion in a distribution data of a particles of a specimen and to analyze the specimen based on particles which appear in the predetermined region, includes preparing first fundamental distribution data by accumulating each distribution data of a first specimen group which belongs to a first category, preparing second fundamental distribution data by accumulating each distribution data of a second specimen group which belongs to a second category, calculating a region on the distribution data where peculiar particles exist in the first or second category by comparing the first and second fundamental distribution data and establishing the calculated region as the particle criterion. The region may also be shifted if needed.
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