Semiconductor memory device including memory cells each having an information storage capacitor component formed over control electrode of cell selecting transistor
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United States of America Patent
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Nov 4, 1997
Grant Date -
N/A
app pub date -
Dec 23, 1994
filing date -
Dec 28, 1993
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A semiconductor memory device has memory cells provided at intersections between word line conductors and data line conductors. Each of the memory cells includes a cell selecting transistor and an information storage capacitor. The capacitor in each of the memory cells includes a first capacitor component formed over the control electrode of the transistor and a second capacitor component formed over a word line conductor which is adjacent to a word line conductor integral with the control electrode of the transistor. Each of the first and second capacitor components has a common electrode, a storage electrode and a dielectric film sandwiched therebetween, and the storage electrode is at a level higher than the common electrode in each of said first and second capacitor components. The storage electrodes of the first and second capacitor components are electrically connected with each other and with one of the semiconductor regions of the transistor. The other semiconductor region of the transistor is electrically connected with one of the data line conductors. Patterning of the storage electrodes of the first and second capacitor components is preferalbly effected by use of masks of a stripe pattern.

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- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
---|---|---|
HITACHI LTD | 6-6 MARUNOUCHI 1-CHOME CHIYODA-KU TOKYO | |
HITACHI INSTRUMENTS ENGINEERING CO LTD | 832-2 NAGAKUBO HORIGUCHI KATSUTA-SHI IBARAKI 312 JAPAN | |
HITACHI ULSI ENGINEERING CORPORATION | 5-CHOME KODAIRA-SHI 20-1 JOUSUIHONCHO TOKYO | |
HITACHI HOKKAI SEMICONDUCTOR LTD | 145 AZA NAKAJIMA NANAE-CHO KAMEDA-GUN HOKKAIDO |
International Classification(s)
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Fujioka, Yasuhide | Fuchu, JP | 8 | 115 |
Kaneko, Yoshiyuki | Kokubunji, JP | 166 | 2469 |
Matsuda, Nozomu | Akishima, JP | 5 | 149 |
Sawamura, Motoko | Higashimurayama, JP | 1 | 20 |
Soeda, Hiroki | Katsuta, JP | 8 | 156 |
Uchiyama, Hiroyuki | Higashimurayama, JP | 142 | 2648 |
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Maintenance Fees
Fee | Large entity fee | small entity fee | micro entity fee | due date |
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Fee | Large entity fee | small entity fee | micro entity fee |
---|---|---|---|
Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
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